Freitag, 16. Juni 2017, 15:15 - 16:45 iCal

Seminar Physikalische Chemie und Materialchemie

Univ.-Prof. Dr. Georg Schitter (TU Wien): "Scientific Instrumentation for Atomic Force Microscopy: Adding Speed and Versatility"

Universität Wien, Fakultät für Chemie, Seminarraum 2, Raum 2124
Währinger Straße 42, 1090 Wien

Vortrag


Since the invention of the atomic force microscope (AFM) in 1986 the developments in its technology led constantly to improvements in resolution, speed, versatility, and usability. This talk will discuss some recent advances in AFM technology, boosting its applicability in academic research as well as in more industry-oriented applications.

One focus in AFM instrumentation is on speeding up the AFM system in order to develop instruments for imaging applications on the nano-scale in real-time, i.e. more than two orders of magnitude faster than conventional AFMs. In order to achieve this performance, every system component has been re-designed and optimized for speed performance. This work demonstrates the potential of such an integrated approach to significantly improve performance of mechatronic imaging systems. The resulting prototype AFM system allows imaging in real-time at speeds of up to 61 images per second. This new generation of AFMs will enable observation of dynamic chemical and biological processes on the molecular level and open a wide range of new applications in the broad fields of bio- and nanotechnology.

A second focus in AFM development is the direct measurement of mechanical and electrical material properties of the sample surface with high spatial resolution. New measurement modes are discussed that allow the direct mapping of surface properties during standard AFM imaging, extending the imaging capability beyond topography measurement without increasing the measurement time, which is important in material science and electronic applications. Further instrumentation efforts aim towards automation of scientific instrumentation for enhancing productivity and reliability of these instruments. Several improvements are demonstrated by corresponding imaging applications.

 


Veranstalter

Institut für Physikalische Chemie, Universität Wien


Kontakt

Univ.-Prof. Dr. Wolfgang Kautek
Universität Wien
Institut für Physikalische Chemie
0043 664 60277 52470
wolfgang.kautek@univie.ac.at